Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System

Product Details
After-sales Service: 1 Year
Function: Wafer Inspect
Demoulding: Automatic
Diamond Member Since 2017

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Year of Establishment
2014-12-30
Registered Capital
147802.18 USD
  • Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
  • Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
  • Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
  • Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
  • Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
  • Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
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Basic Info.

Model NO.
MDWX-WI8100
Condition
New
Certification
CE
Warranty
12 Months
Automatic Grade
Automatic
Installation
Vertical
Driven Type
Electric
Mould Life
>1,000,000 Shots
Transport Package
Wooden Case
Trademark
minder-hightech
Origin
China
Production Capacity
1000

Product Description

MDWX-WI8100
Automatic Wafer Inspection System
1. Upgrade the re-judgment of various process production lines to fully automated mode (loading/positioning/photographing/storing images)

2. Provide conversion and import of various defect maps
3. Automatic measurement function, automatic CD/Overlay calculation (with 100x or higher objective lens)
4. Automatic code reading, connect re-judgment/sampling information to MES, and automatically upload
5. With Al automated re-judgment upgrade function, improve re-judgment accuracy
6. Built-in image offline database software, manual offline analysis

Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System

Automatic photo takingMicroscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
Defect map import
Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
Microscopic Inspection Semiconductor Wafer Defect Detection Mdwx-Wi8100 Automatic Wafer Inspection System
Equipment Specifications
Model MDWX-WI8100
Loader Minder-Hightech
Optical system Minder-Hightech
Software function Defect map coordinate reading (corresponding to KLA, Camtek, etc.), and automatic alignment
Defect map information screening and automatic photography, archiving
Automatic image measurement: CD, Overlay
Defect map image database
Automatic light source adjustment system/automatic image camera function/automatic positioning measurement
Minder-Hightech is sales and service representative in semiconductor and electronic product industry equipment. 
Since 2014,the company is committed to providing customers with Superior, Reliable, and One-Stop Solutions for machinary equipment. 


FAQ
1. About Price:
All of our prices are competitive and negotiable. The price varies depending on the configuration and customization complexity of your device.

2. About Sample:
We can provide sample production services for you, but you may provide some fees.

3. About Payment:
After the plan is confirmed, you need to pay us a deposit first, and the factory will start preparing the goods. After the equipment is ready and you pay the balance, we will ship it.

4. About Delivery:
After the equipment manufacturing is completed, we will send you the acceptance video, and you can also come to the site to inspect the equipment.

5. Installation and Debugging:
After the equipment arrives at your factory, we can dispatch engineers to install and debug the equipment. We will provide you with a separate quotation for this service fee.

6. About Warranty:
Our equipment has a 12-month warranty period. After the warranty period, if any parts are damaged and need to be replaced, we will only charge the cost price.
 

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