Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic

Product Details
After-sales Service: 1 Year
Function: Wafer Inspect
Demoulding: Automatic
Diamond Member Since 2017

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Year of Establishment
2014-12-30
Registered Capital
147802.18 USD
  • Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
  • Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
  • Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
  • Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
  • Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
  • Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
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Basic Info.

Model NO.
MD
Condition
New
Certification
CE
Warranty
12 Months
Automatic Grade
Automatic
Installation
Vertical
Driven Type
Electric
Mould Life
>1,000,000 Shots
Transport Package
Wooden Case
Trademark
minder-hightech
Origin
China
Production Capacity
1000

Product Description

MDWX-WI8100
Automatic Wafer Inspection System
1. Upgrade the re-judgment of various process production lines to fully automated mode (loading/positioning/photographing/storing images)

2. Provide conversion and import of various defect maps
3. Automatic measurement function, automatic CD/Overlay calculation (with 100x or higher objective lens)
4. Automatic code reading, connect re-judgment/sampling information to MES, and automatically upload
5. With Al automated re-judgment upgrade function, improve re-judgment accuracy
6. Built-in image offline database software, manual offline analysis

Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic

Automatic photo takingSemiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
Defect map import
Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
Semiconductor Wafer Re Evaluation Sampling Measurement Test Detecter Fully Automatic Ai Microscopic
Equipment Specifications
Model MDWX-WI8100
Loader Minder-Hightech
Optical system Minder-Hightech
Software function Defect map coordinate reading (corresponding to KLA, Camtek, etc.), and automatic alignment
Defect map information screening and automatic photography, archiving
Automatic image measurement: CD, Overlay
Defect map image database
Automatic light source adjustment system/automatic image camera function/automatic positioning measurement
Minder-Hightech is sales and service representative in semiconductor and electronic product industry equipment. 
Since 2014,the company is committed to providing customers with Superior, Reliable, and One-Stop Solutions for machinary equipment. 


FAQ
1. About Price:
All of our prices are competitive and negotiable. The price varies depending on the configuration and customization complexity of your device.

2. About Sample:
We can provide sample production services for you, but you may provide some fees.

3. About Payment:
After the plan is confirmed, you need to pay us a deposit first, and the factory will start preparing the goods. After the equipment is ready and you pay the balance, we will ship it.

4. About Delivery:
After the equipment manufacturing is completed, we will send you the acceptance video, and you can also come to the site to inspect the equipment.

5. Installation and Debugging:
After the equipment arrives at your factory, we can dispatch engineers to install and debug the equipment. We will provide you with a separate quotation for this service fee.

6. About Warranty:
Our equipment has a 12-month warranty period. After the warranty period, if any parts are damaged and need to be replaced, we will only charge the cost price.
 

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