Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection

Product Details
After-sales Service: 1 Year
Demoulding: Automatic
Condition: New
Diamond Member Since 2017

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Registered Capital
1000000 RMB
  • Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection
  • Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection
  • Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection
  • Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection
  • Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection
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  • Overview
  • Product Description
Overview

Basic Info.

Model NO.
MH
Certification
CE
Warranty
24 Months
Automatic Grade
Automatic
Installation
Vertical
Driven Type
Electric
Mould Life
>1,000,000 Shots
Product Type
6", 8", 12" Frame Wafer
Cutting Path Inspection Items
6", 8", 12" Frame Cassetee
Precision
0.55μm/Pixel
Optional and Customized
Ink Module, IR Module
Trademark
MINDER-HIGHTECH
Origin
China
Production Capacity
1000

Product Description

Product Description

 Wafer 2D Defect Inspection System
Introduction to Main Modules
EFEM:
1.Manual loading of 8-inch or 12-inch open cassettes at the feeding station and automatically switch the product track size for compatibility.
2.The robot adopts a drag-and-drop design, ignoring the influence of interlayer spacing.
3.With a material pushing interference alarm, there is a buffer distance and sensor alarm when the product is blocked.

STAGE:
1.Flying image acquisition for inspection.
2.Reserved stations can be equipped with optional INK modules or IR modules.
3.Achieves sub-micron level accuracy.
4.Delivers results with minimal waiting time.
Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect InspectionIntelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect InspectionIntelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect InspectionIntelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection
Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect InspectionIntelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect InspectionTechnical Parameter
Project Content
Product Type 6", 8", 12" frame wafer
2D Inspection ltems Foreign objects, residual glue, particles, scratches, cracks, contamination, CP deviation, excessive area, etc
Cutting channel deviation and chipping
Cutting Path Inspection Items 6", 8", 12" frame cassetee
Lens and Resolution 2x(2.75um)/3.5x(1.57um)/
5x(1.1um)/7.5x(0.73um)/10x(0.55um)
Precision 0.55μm/pixel
Optional and Customized INK module, IR module

Intelligent Automation Detection System Automatic Optical Inspect Aoi Wafer 2D Defect Inspection

 

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