Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe

Product Details
After-sales Service: 1 Year
Warranty: 1 Year
Magnification: 500-1000X
Diamond Member Since 2017

Suppliers with verified business licenses

Audited Supplier

Audited by an independent third-party inspection agency

Year of Establishment
2014-12-30
Registered Capital
147802.18 USD
  • Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
  • Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
  • Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
  • Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
  • Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
  • Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
Find Similar Products

Basic Info.

Model NO.
MD-KM210LCD
Usage
Teaching, Research
Principle
Optics
Trademark
MH
Origin
China
Production Capacity
1000

Product Description

MD-KM210 LCD DifferentiaInterference Microscope
MD-KM210 is the latest FPD inspection microscope, specially designed for LCD industry/ TFT glass/COG conductive particle indentation and particle blasting inspection. Its
differential interference effect is comparable to that of imported brands.
MD-KM210 adopts a newly designed long working distance objective lens, semi-
apochromatic technology, multi-layer broadband coating technology, long-life LED light source and a variety of highly functional accessories to meet various inspection needs. It  can be used for bright field, simple polarization and differential interference observation.
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObservePerformance characteristics:
. The TFT-LCD liquid crystal detection DIC microscope model adopts a newly designed long working distance objective lens, semi-apochromatic technology, and multi-layer    broadband coating technology.
. A clear, sharp and high-contrast microscopic image can be obtained under various observation methods
. A variety of highly functional accessories can meet the needs of various LCD scenarios.

Independent metallographic detection system
Different from traditional metallographic microscopes, the MD-KM210 metallographic  system microscope has a compact structure design, a dignified appearance, and more   flexible operation. It integrates multiple observation functions such as bright field, dark field, polarization, DIC differential interference, etc., which can be selected according to actual applications.
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
High eye point, wide field of view, diopter-adjustable flat-field eyepiece
23mm high eye point, wide field of view, flat field eyepiece, adjustable diopter.
25mm ultra-wide 25mm field of view, high eye point eyepiece, compared with the conventional   22mm field of view, the field of view is flatter and wider, and the edge of the field of view can be guaranteed to be clear and bright, giving users a more comfortable visual experience. Provide a   more flat observation range and improve work efficiency. The larger range of diopter adjustment can meet the needs of more users.
Other magnifications and fields of view can also be selected, and pointers, micrometers and diopter adjustable functions can be added according to different needs.
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe

High-quality professional LCD inspection metallographic objective lens
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
Name Magnification Numerical aperture Working distance


LCD detection bright and dark field
objective lens
5X 0.15 20mm
10X 0.30 11mm
20X 0.45 3.0mm
50X 0.55 8.0mm
100X 0.80 3.0mm

Polarization components and DIC Nomarski differential interference contrast system accessories
. The polarization system includes a polarizer plate and an analyzer plate, which can be used for polarization detection. In semiconductor and PCB detection, stray light can be eliminated and details can be cleaned. The 360-degree rotating analyzer can conveniently observe the state of the specimen under different polarization angles without moving the specimen.
. On the basis of orthogonal polarization, DIC prisms are inserted to perform DIC differential interference contrast observation. DIC technology can produce obvious relief effects on the surface of objects with tiny height differences, greatly improving image contrast.
. The use of high-performance differential interference components can convert subtle height differe nces  that cannot be detected under bright field observation into high-contrast light and dark differe  nces and express them in the form of three-dimensional relief. It is widely used in LCD conductive particles, precision disk surface scratch detection and other fields.
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
High-precision mechanical stage
The large-stroke platform includes a fast-moving device. The platform area is 525*330mm.
The moving stroke is 210mmX210mm mechanical platform, and the X and Y directions are coaxially adjustable.
The manual XY stage can coarsely and finely adjust the stage position through the built-in clutch mechanism and XY adjustment handle.
The clutch device allows the operator to move the stage freely during observation, improving overall  efficiency. The stage can be moved without restriction during observation using the eyepiece, making observation faster and more comfortable.
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
Microscope usage effect display
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveComputer type LCD inspection microscope technical specifications:
Model Configuration
Optical system Infinity chromatic aberration corrected optical system
Optical
magnification
50x-500x (optional 500/1000x)
Digital
magnification
150x-1500x (21.5-inch display)
Industrial camera 12 million 1/1.8-inch color Sony industrial chip (optional 6.3 million and 20 million pixels)

Observation tube
Positive image, infinity hinged three-way observation tube, pupil distance adjustment : 50mm~76 mm, two-stage splitting ratio binocular : tr inocular =  100:0
Reverse image, infinity hinged three-way observation tube, pupil distance adjustment : 50mm~76 mm, two-stage splitting ratio binocular : tr inocular = 100:0
Eyepiece High eye point wide field eyepiece SWH10X-H/23mm, diop ter adjustable
High eye point wide field eyepiece SWH10X-H/25mm, diop ter adjustable



Objective lens
Infinity semi-apochromatic long-distance bright and dark field objective lens 45MM Visible light metallographic objective lens 5X NA0.15 WD14.8mm
Infinity semi-apochromatic long-distance bright and dark field objective lens 45MM Visible light metallographic objective lens 10X NA0.30 WD8.5 mm
Infinity semi-apochromatic long-distance bright and dark field objective lens 45MM Visible light metallographic objective lens 20X NA0.45 WD11.9mm
Infinity semi-apochromatic long-distance bright and dark field objective lens 45MM Visible light metallographic objective lens 50X NA0.75 WD3.0mm
Infinity semi-apochromatic long-distance bright and dark field objective lens 45MM Visible light metallographic objective lens 100X NA0.80 WD3.0mm
Infinity semi-asymmetric distance bright and dark field objective lens 45MM Visible light metallographic objective lens 100X NA0.90 WD1.0mm
Objective lens
converter
5-hole bright and dark field objective lens converter (with DIC slot) .
5-hole bright and dark field electric objective lens converter (electric/with DIC slot) .
Frame Upper  light source Reflection rack, low hand position coarse and fine coaxial focusing mechanism. Coarse adjustment stroke 35mm, fine adjustment accuracy 0.001mm.
With anti-slip adjustment tension device and random upper limit device. Built- in 100-240V wide voltage system, digital dimming, with light intensity setting and reset function
Stage 4-inch stage, platform area 310*240mm, moving stroke : 100mmX100mm mechanical stage, coaxial adjustment in X and Y directions ;
Condenser Swing-out achromatic condenser (N.A.0.9)
Interference plate Differential interference film
Reflection  illuminator Bright and dark field reflection illuminator, with variable aperture diaphragm, field diaphragm, center adjustable, with filter slot,
With polarizer/analyzer slot,
Light room 10W adjustable LED lamp house, universal for transmission and reflection, pre- set center
Camera
interface
Photographic accessories : 0.65X, C-type interface, adjustable focus (optional 0.5X/1X)
Polarization component Polarizer plate, 360 ° rotating analyzer plate
Computer Computer and monitor
Measurement software Measuring software OMT-1.5D, software controls the electric objective
turntable, takes photos, records videos, measures, real-time image stitching, depth of field fusion
Ruler High-precision micrometer, scale value 0.01mm

Product size: (mm)
Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
Minder-Hightech is sales and service representative in semiconductor and electronic product industry equipment. 
Since 2014,the company is committed to providing customers with Superior, Reliable, and One-Stop Solutions for machinary equipment. 

Semiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field ObserveSemiconductor Wafer Inspect MD-Km210LCD Differential Interference Microscope Dic Bright-Field Dark-Field Observe
FAQ
1. About Price:
All of our prices are competitive and negotiable. The price varies depending on the configuration and customization complexity of your device.

2. About Sample:
We can provide sample production services for you, but you may provide some fees.

3. About Payment:
After the plan is confirmed, you need to pay us a deposit first, and the factory will start preparing the goods. After the equipment is ready and you pay the balance, we will ship it.

4. About Delivery:
After the equipment manufacturing is completed, we will send you the acceptance video, and you can also come to the site to inspect the equipment.

5. Installation and Debugging:
After the equipment arrives at your factory, we can dispatch engineers to install and debug the equipment. We will provide you with a separate quotation for this service fee.

6. About Warranty:
Our equipment has a 12-month warranty period. After the warranty period, if any parts are damaged and need to be replaced, we will only charge the cost price.
 

Send your message to this supplier

*From:
*To:
*Message:

Enter between 20 to 4,000 characters.

This is not what you are looking for? Post a Sourcing Request Now
Contact Supplier
People who viewed this also viewed